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SEARCH: Assessments
13 Assessments Found
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AM - Texas A&M, College Station
BD - Bradley University
BS - Boise State University
CO - Colorado State University
DL - University of Delaware
IA - Iowa State University
IP - Indiana University-Purdue University
LE - Lehigh University
MA - University of Massachusetts
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NC - North Carolina State
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AR - Univ. of Arkansas
AS - Arizona State University
AT - North Carolina A&T
DS - South Dakota State
GT - Georgia Institute of Technology
HO - Hofstra Univ.
IC - University of Illinois, Chicago
KG - Texas A&M, Kingsville
KU - Univ. of Kansas
LL - University of Louisiana, Lafayette
LM - Loyola Marymount University
LT - Louisiana Tech
ME - Univ. of Maine
MO - Univ. of Missouri, Rolla
MS - Mississippi State
ND - Notre Dame Univ.
NV - Univ. of Nevada
OD - Old Dominion Univ.
PV - Prairie View, A&M
RU - Rutgers, State Univ. of NJ
ST - Stevens Institute of Technology
TA - University of Texas, Arlington
TN - Univ. of Tennessee
TP - Prairie View, A&M
TS - Tri-Cities Univ.
UF - University of Florida
UL - Univ. of Louisville
UU - University of Utah
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WI - University of Wisconsin, Milwaukee
Per Page
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ID
Year
Products
(1-13)
AS0433
2006
Avionics, Electronics
AS0432
2006
Avionics, Electronics
AS0426
2006
Printed circuit boards
AS0420
2006
Optical scanning
AS0408
2005
Semiconductors
AS0405
2005
Aircraft components
AS0396
2004
Satellite communications equipment
AS0390
2004
Printed Circuit Boards
AS0371
2003
Printed Circuit Boards
AS0370
2003
Printed Circuit Boards
AS0359
2003
Laboratory and Analytical Instruments for Medical Industry
AS0354
2003
Load Cells and Force Measurement Devices
AS0347
2002
Ceramic Microelectronics Packages for Wireless and Digital Applications
(1-13)
